Application Notes
Our application notes cover the latest developments for precision control in atomic force microscopy to sample imaging in life sciences.Queensgate reaches the pinnacle of nanopositioning performance [Article]
The sucess of Queensgate, a supplier of high-precision piezo systems, shows that you don't have to be a huge company to deliver the best in nanopositioning.
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Queensgate: collaborating to push the boundaries of measurement science [Article]
The National Physical Laboratory and Queensgate share an unrelenting passion for better precision at the cutting edge of measurement science.
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Innovation in optical interferometry: the secret of success in nanopositioning QA [Article]
Nanopositioning specialist Queensgate and the UK’s National Physical Laboratory (NPL) have forged a productive collaboration yielding a good-practice implementation model for Queensgate’s in-house test and measurement programme
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Demonstration of closed loop velocity control for fast imaging techniques using high-speed AFM [Poster]
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Innovation in nanopositioning – High accuracy velocity control at nanometer resolution [Paper]
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Fast AFM scanning: realizing the gains of closed-loop velocity control [Article]
Nanopositioning specialist Queensgate is lining up a suite of enabling technologies for applications in high-speed, high-accuracy atomic force microscopy(AFM) systems
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Capacitive displacement nanosensors are made to measure in extreme environments [Article]
From synchrotron light sources to long-term space missions, nanopositioning specialist Queensgate is eyeing niche markets and extreme operating conditions for its NC series of nanosensors
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Spatial Positioning Correction for Multi-Axis Nanopositioning Stages [Poster]
All moving systems have unwanted motion that causes positioning errors. This is most significant for longer-range stages, and can be the limiting factor in positioning accuracy. This poster, presented at ASPE 2022 explores Queensgate's work with NPL to correct for these errors.
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Incremental Gains and Continuous Improvements for Nanopositioning Quality Assurance [Article]
An ongoing R&D collaboration with NPL scientists is helping to enhance end-to-end QA across product design, development and manufacturing.
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Semiconductor metrology: positioning is key [Article]
Specialist positioning subsystems provide core building blocks in 3D surface measurement and inspection solutions for the semiconductor industry.
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Large area high-speed atomic force microscopy with arbitrary scan path playback [Poster]
A novel control system for a two-axis flexure stage, with 100 μm × 100 μm scanning range, has enabled large area High-speed Atomic Force Microscope (HS-AFM) scanning. Presented at Euspen Special Interest Conference: Precision Motion Systems & Control.
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Wafer mask alignment: Queensgate focuses on the move to 300 mm [Article]
Modern semiconductor fabrication involves aligning silicon wafers and photolithography masks to nanometer precision. As the industry shifts from using 200 mm diameter wafers to 300 mm wafers, achieving alignment is becoming more challenging.
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Achieving sub-nanometer spatial resolution in atomic force microscopy (AFM) [Paper]
Read about how Queensgate achieve resolutions of fractions of a nanometer for the AFM and SFM market.
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