Application Notes
Our application notes cover the latest developments for precision control in atomic force microscopy to sample imaging in life sciences.Queensgate reaches the pinnacle of nanopositioning performance [Article]
The sucess of Queensgate, a supplier of high-precision piezo systems, shows that you don't have to be a huge company to deliver the best in nanopositioning.
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Queensgate: collaborating to push the boundaries of measurement science [Article]
The National Physical Laboratory and Queensgate share an unrelenting passion for better precision at the cutting edge of measurement science.
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Innovation in optical interferometry: the secret of success in nanopositioning QA [Article]
Nanopositioning specialist Queensgate and the UK’s National Physical Laboratory (NPL) have forged a productive collaboration yielding a good-practice implementation model for Queensgate’s in-house test and measurement programme
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Demonstration of closed loop velocity control for fast imaging techniques using high-speed AFM [Poster]
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Innovation in nanopositioning – High accuracy velocity control at nanometer resolution [Paper]
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Fast AFM scanning: realizing the gains of closed-loop velocity control [Article]
Nanopositioning specialist Queensgate is lining up a suite of enabling technologies for applications in high-speed, high-accuracy atomic force microscopy(AFM) systems
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Capacitive displacement nanosensors are made to measure in extreme environments [Article]
From synchrotron light sources to long-term space missions, nanopositioning specialist Queensgate is eyeing niche markets and extreme operating conditions for its NC series of nanosensors
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Spatial Positioning Correction for Multi-Axis Nanopositioning Stages [Poster]
All moving systems have unwanted motion that causes positioning errors. This is most significant for longer-range stages, and can be the limiting factor in positioning accuracy. This poster, presented at ASPE 2022 explores Queensgate's work with NPL to correct for these errors.
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Incremental Gains and Continuous Improvements for Nanopositioning Quality Assurance [Article]
An ongoing R&D collaboration with NPL scientists is helping to enhance end-to-end QA across product design, development and manufacturing.
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Semiconductor metrology: positioning is key [Article]
Specialist positioning subsystems provide core building blocks in 3D surface measurement and inspection solutions for the semiconductor industry.
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Large area high-speed atomic force microscopy with arbitrary scan path playback [Poster]
A novel control system for a two-axis flexure stage, with 100 μm × 100 μm scanning range, has enabled large area High-speed Atomic Force Microscope (HS-AFM) scanning. Presented at Euspen Special Interest Conference: Precision Motion Systems & Control.
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Achieving sub-nanometer spatial resolution in atomic force microscopy (AFM) [Paper]
Read about how Queensgate achieve resolutions of fractions of a nanometer for the AFM and SFM market.
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